Transistor Characteristics Apparatus (Socket Type)
Product Code : SCL-EI-12142
This Educational Instrument facilitates the empirical analysis of NPN and PNP transistor behavior in Common Base (CB) and Common Emitter (CE) configurations. Engineered for Undergraduate Physics and Electronics Vocational Curricula, the unit integrates high-stability regulated DC power supplies and precision monitoring interfaces. The apparatus is optimized for high-frequency use in institutional laboratories requiring repeatable data acquisition for semiconductor load-line analysis and parameter determination.
Technical Specifications
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Tender Specification |
OEM Technical Detail |
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Circuit Configuration |
Support for PNP and NPN transistors in CE and CB modes via dedicated socket interface. |
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Integrated Power Supplies |
Dual regulated DC sources: 0–1V (Base-Emitter) and 0–10V (Collector-Emitter); IC-stabilized. |
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Monitoring Instrumentation |
Four precision meters (Analog/Digital) for simultaneous $V_{in}$, $I_{in}$, $V_{out}$, and $I_{out}$ tracking. |
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Chassis Construction |
Heavy-duty MS sheet metal enclosure; scratch-resistant powder-coated finish. |
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Input Voltage |
230V AC ±10% at 50Hz; fuse-protected primary circuit. |
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Component Interfacing |
4mm safety-shrouded sockets with color-coded patch cords. |
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ISO Compliance Code |
ISO 9001:2015 (Manufacturing Quality Management). |
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HS Code |
9023.00 (Instruments, apparatus and models, designed for demonstrational purposes). |
Key Pedagogical Outcomes (Bloom’s Taxonomy)
Feature: Dual Variable DC Power Supplies.
Outcome: Enables students to independently manipulate bias voltages to map Input/Output characteristic curves, facilitating the transition from theoretical semiconductor physics to practical application.
Feature: Multi-Meter Integration.
Outcome: Supports simultaneous data acquisition of. This reduces measurement latency and allows for real-time visualization of the transistor's active, saturation, and cut-off regions.
Feature: Universal Socket Interface.
Outcome: Facilitates rapid interchangeability of transistor types (e.g., Silicon vs. Germanium) to observe variations in junction potentials and leakage currents, reinforcing comparative analysis skills.
Feature: Schematic Overlay Panel.
Outcome: Direct hardware-to-diagram correlation assists students in identifying circuit nodes, supporting advanced troubleshooting and circuit-building competencies.
International Logistics & Compliance
This Educational Instrument is prepared for global distribution with export-grade seaworthy crating (ISPM-15 compliant) to ensure structural integrity during maritime or aerial transit. Documentation provided with each unit includes the Manufacturer’s Authorization Form (MAF), Certificate of Conformance (CoC), and detailed technical manuals in English. The apparatus features a tropicalized design, tested for continuous operational stability in environments reaching 45°C and 90% non-condensing humidity, ensuring longevity in diverse geographical laboratory settings.
Why Source from the OEM
Procurement via the Original Equipment Manufacturer ensures vertical integration of the production cycle, from PCB etching and component soldering to final chassis fabrication. Each unit undergoes rigorous batch-testing for meter calibration accuracy and power supply ripple-rejection ratios. Direct factory sourcing guarantees long-term availability of genuine spare parts and technical support, eliminating the logistical delays and inflated margins associated with third-party traders.
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