PN Junction Diode Characteristics Apparatus – 2 Meter
Product Code : SCL-EI-12149
Engineered for the empirical determination of V-I characteristics in silicon and germanium junctions, this 2-meter apparatus facilitates high-precision mapping of forward and reverse bias regions. Optimized for University-level physics and Vocational Engineering (EEE) laboratories, it supports standardized curriculum requirements for semiconductor analysis, ensuring data repeatability under ISO 9001:2015 quality management protocols for institutional procurement.
Technical Specifications
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Tender Specification |
OEM Technical Detail |
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Circuit Architecture |
Dual-circuit test bed for Forward and Reverse bias characterization |
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Instrumentation |
2x Analog or Digital meters (Voltmeter and Ammeter/Micro-ammeter) |
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Voltage Regulation |
Integrated DC Regulated Power Supply (Range: 0-3V and 0-30V) |
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Current Measurement |
Multi-range switching for (Forward) and $\mu A$ (Reverse) analysis |
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Material Grade |
High-impact, ruggedized ABS/Metallic enclosure with FR4 PCB substrate |
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Dimensions |
Standardized benchtop footprint (approx. 250mm x 330mm x 100mm) |
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ISO Compliance Code |
Manufactured under ISO 9001:2015 Quality Management Systems |
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HS Code |
9023.00 (Instruments, apparatus and models, designed for demonstrational purposes) |
Key Pedagogical Outcomes (Bloom’s Taxonomy)
Independent Bias Control (0-3V/0-30V): Allows students to manipulate the potential barrier with granularity, facilitating the Application of bias voltage increments to pinpoint cut-in and breakdown voltages.
Dual-Range Current Monitoring Enables the Analysis of diffusion vs. leakage current magnitudes, supporting the characterization of majority and minority carrier dynamics.
Integrated Circuit Schematic Overlay: Bridges the gap between theoretical symbols and physical hardware, supporting the Synthesis of complex semiconductor networking and biasing configurations.
Discrete Component Interface: Uses real-world diodes rather than simulations, allowing students to Evaluate the impact of thermal drift and component tolerances on semiconductor efficiency.
International Logistics & Compliance
This educational instrument is prepared for global distribution under stringent export protocols. Standard shipping configurations utilize export-grade seaworthy crating (ISPM-15 compliant) to maintain structural and electronic integrity during multi-modal transit. Each unit is accompanied by a comprehensive procurement documentation suite, including the Manufacturer’s Authorization Form (MAF), IQ/OQ/PQ Calibration Certification, and Technical User Manuals in English. The hardware features a tropicalized internal architecture, verified for consistent performance in high-ambient environments up to 45°C and 90% non-condensing humidity.
Why Source from the OEM
Direct procurement from the Original Equipment Manufacturer ensures vertical integration and long-term asset viability. Unlike third-party traders, our facility maintains in-house PCB fabrication and rigorous component screening, ensuring that every apparatus exhibits uniform electrical impedance and linear meter response across bulk orders. Sourcing from the OEM guarantees direct factory spares availability and a verified chain of custody. Every batch undergoes rigorous bench-testing for uniformity, ensuring that institutional laboratory results remain consistent across multiple student workstations for the duration of the instrument's lifecycle.
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